Microstructure-dependent dynamic stability analysis of torsional NEMS scanner in van der Waals regime

Abdi, J. and Keivani, M. and Abadyan, M. (2016) Microstructure-dependent dynamic stability analysis of torsional NEMS scanner in van der Waals regime. International Journal of Modern Physics B, 30 (18).

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Abstract

The physico-mechanical behavior of nanoscale devices might be microstructure dependent. However, the classical continuum theory cannot correctly predict the microstructure dependency. In this paper, the strain gradient theory is employed to examine the instability characteristics of a nanoscanner with circular geometry. The governing equation of the scanner is derived incorporating the Coulomb and van der Waals (vdW) forces. The influences of applied voltage, squeeze damping and microstructure parameters on the dynamic instability of equilibrium points are studied by plotting the phase portrait and bifurcation diagrams. In the presence of the applied voltage, the phase portrait shows the saddle-node bifurcation while for freestanding scanner a subcritical pitchfork bifurcation is observed. It is concluded that the microstructure parameter enhances the torsional stability.

Item Type: Article
Additional Information: cited By 0
Uncontrolled Keywords: dynamic instabilityو Microstructure وscannerو strain gradient theoryو van der Waals force
Subjects: QT physiology
Divisions: Reserach Vice-Chancellar Department
Depositing User: zahra bagheri .
Date Deposited: 04 Jul 2017 05:55
Last Modified: 04 Jul 2017 05:55
URI: http://eprints.skums.ac.ir/id/eprint/746

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